| Component Failure {DataSetsUni} | R Documentation |
Time to failure of an electronic component
Description
The function allows to provide the time to failure in hours of an electronic component subjected to an accelerated life test.
Usage
data_electronicf
Arguments
data_electronicf |
A vector of (non-negative integer) values. |
Details
The data represent the time to failure in hours of an electronic component subjected to an accelerated life test. Recently, it is used by Tripathi. (2021) and fitted the inverse log-logistic distribution.
Value
data_electronicf gives the time to failure in hours of an electronic component.
Author(s)
Muhammad Imran.
R implementation and documentation: Muhammad Imran imranshakoor84@yahoo.com.
References
Tripathi, H., Dey, S., & Saha, M. (2021). Double and group acceptance sampling plan for truncated life test based on inverse log-logistic distribution. Journal of Applied Statistics, 48(7), 1227-1242.
Montgomery, D. C. (2010). Managing, controlling, and improving quality. Wiley Global Education.
See Also
data_failureairc, data_windshieldf, data_breakdown
Examples
x<-data_electronicf
summary(x)