Devices Breakdown {DataSetsUni}R Documentation

The times of breakdown of a sample of 25 devices

Description

The function allows to provide the times of breakdown of a sample of 25 devices at 180C.

Usage

data_breakdownt

Arguments

data_breakdownt

A vector of (non-negative integer) values.

Details

The data consist of the times of breakdown of a sample of 25 devices at 180C. Recently, it is used by Alotaibi et al. (2022) and fitted a new three-parameter inverse Weibull distribution.

Value

data_breakdownt gives the breakdown times of devices.

Author(s)

Muhammad Imran.

R implementation and documentation: Muhammad Imran imranshakoor84@yahoo.com.

References

Alotaibi, R., Okasha, H., Rezk, H., & Nassar, M. (2023). A New Three-Parameter Inverse Weibull Distribution with Medical and Engineering Applications. CMES-COMPUTER MODELING IN ENGINEERING & SCIENCES, 135(2), 1255-1274.

Pham, H. (2003). Handbook of reliability engineering (Vol. 1). H. Pham (Ed.). London: Springer.

See Also

data_breakdown, data_Stress

Examples

x<-data_breakdownt
summary(x)

[Package DataSetsUni version 0.1 Index]