Chipavg {BSDA} | R Documentation |

## Measurements of the thickness of the oxide layer of manufactured integrated
circuits

### Description

Data for Exercises 6.49 and 7.47

### Usage

Chipavg

### Format

A data frame/tibble with 30 observations on three variables

- wafer1
thickness of the oxide layer for `wafer1`

- wafer2
thickness of the oxide layer for `wafer2`

- thickness
average thickness of the oxide layer of the eight measurements
obtained from each set of two wafers

### Source

Yashchin, E. 1995. “Likelihood Ratio Methods
for Monitoring Parameters of a Nested Random Effect Model.”
*Journal of the American Statistical Association*, 90, 729-738.

### References

Kitchens, L. J. (2003) *Basic Statistics and Data Analysis*.
Pacific Grove, CA: Brooks/Cole, a division of Thomson Learning.

### Examples

EDA(Chipavg$thickness)
t.test(Chipavg$thickness, mu = 1000)
boxplot(Chipavg$wafer1, Chipavg$wafer2, name = c("Wafer 1", "Wafer 2"))
shapiro.test(Chipavg$wafer1)
shapiro.test(Chipavg$wafer2)
t.test(Chipavg$wafer1, Chipavg$wafer2, var.equal = TRUE)

[Package

*BSDA* version 1.2.0

Index]