spef-package {spef} | R Documentation |
spef: Semiparametric Estimating Functions
Description
spef
is an R package that consists of a collection of functions for fitting
semiparametric regression models for panel count survival data.
Estimating procedures include: Wang-Yan’s augmented estimating equations (AEE, AEEX),
Huang-Wang-Zhang’s method (HWZ), Zhang’s maximum pseudolikelihood (MPL),
Maximum pseudolikelihood with I-Splines (MPLs), Maximum likelihood with I-Splines (MLs),
Sun-Wei’s method (‘EE.SWa', 'EE.SWb', 'EE.SWc'), Hu-Sun-Wei’s method ('EE.HSWc', 'EE.HSWm'),
and accelerated mean model ('AMM').
Author(s)
Maintainer: Sy Han (Steven) Chiou schiou@utdallas.edu
Authors:
Xiaojing Wang
Jun Yan
References
Chiou, S., Xu, G., Yan, J., and Huang, C.-Y. (2017). Semiparametric estimation of the accelerated mean model with panel count data under informative examination times. Biometrics, to appear. <doi: 10.1111/biom.12840>.
Huang, C.-Y., Wang, M., and Zhang, Y. (2006). Analysing panel count data with informative observation times. Biometrika, 93(4), 763–776.
Hu, X. J., Sun, J. and Wei, L. J. (2003). Regression parameter estimation from panel counts. Scandinavian Journal of Statistics, 30, 25–43.
Lu, M., Zhang, Y., and Huang, J. (2007). Estimation of the mean function with panel count data using monotone polynomial splines. Biometrika, 94(3), 705–718.
Sun, J. and Wei, L. J. (2000). Regression analysis of panel count data with covariates-dependent observation and censoring times. Journal of the Royal Statistical Society, Series B: Statistical Methodology, 62(2), 293–302.
Wang, X. and Yan, J. (2011). Fitting semiparametric regressions for panel count survival data with an R package spef. Computer methods and programs in biomedicine 104(2), 278–285.
Wang, X. and Yan, J. (2013). Augmented estimating equations for semiparametric panel count regression with informative observation times and censoring time. Statistica Sinica, 23(1), 359–381.
Zhang, Y. (2002). A Semiparametric pseudolikelihood estimation method for panel count data. Biometrika, 89(1), 39–48.
See Also
Useful links: