| SiRstv {RbyExample} | R Documentation |
NIST SiRstv Data
Description
Measurements of bulk resistivity of silicon wafers made at NIST with 5 probing instruments on each of 5 days.
Usage
SiRstv
Format
25 obs. of 2 variables:
- Instrument
replicate
- Resistance
resistance
Details
https://www.itl.nist.gov/div898/strd/anova/SiRstv_info.html
Source
https://www.itl.nist.gov/div898/strd/anova/SiRstv.html
References
NIST Standard Reference Datasets: https://www.itl.nist.gov/div898/strd/index.html
[Package RbyExample version 0.0.100 Index]