phi.syn {AdvBinomApps}

Assembling of devices

Description

Function to compute probability of having a certain number of failures out of min(n) devices, which are randomly assembled out of a certain number of chip subsets.

Usage

phi.syn(k, n)

Arguments

k

vector of numbers of failures for each subset.

n

vector of numbers of inspections for each subset.

Value

phi

data frame with possible numbers of failures (out of min(n) assembled devices) and associated probabilities.

Author(s)

Daniel Kurz, Horst Lewitschnig

Maintainer: Horst Lewitschnig [e-mail]

References

D. Kurz, H. Lewitschnig and J. Pilz: Failure probability estimation under additional subsystem information with application to semiconductor burn-in. Resubmitted to: Journal of Applied Statistics, 2015.

See Also

ci.syn phi.syn.cm ci.syn.cm

Examples

k<-c(1,2)
n<-c(10,15)
phi.syn(k,n)

k<-c(0,1,1,1)
n<-c(110000,220000,150000,330000)
phi.syn(k,n)